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Article · International Journal of Circuit Theory and Applications · March 8, 2019

An accurate and simplified small signal parameter extraction method for GaN HEMT

Ahmad Khusro, Mohammad Hashmi, Abdul Quaiyum Ansari, Aditya Mishra, Mohammad Tarique

Abstract

Summary In this paper, development of a small signal model for 2 × 200 μm GaN HEMT based on the conventional 20‐element model is presented. The proposed model presents a direct parameter extraction algorithm, instead of the hybrid optimization approach, that provides simplification, accuracy, and less computational complexity. The extrinsic elements are extracted using a modified cold pinch‐off condition while discarding the unwanted forward biasing of the gate. The negative drain to source capacitance Cds is also observed in the ohmic region (for smaller VDS). An excellent agreement found between the measured and modeled data for a wide range of frequencies and bias values shows the effectiveness of the proposed approach. The proposed modeling technique is validated with a good agreement between the achieved bias dependency of intrinsic parameter values and the respective theoretical parameter values.

GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor TechnologiesAdvanced Power Amplifier DesignGaN HEMTsmall-signal modelingparameter extraction

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